atomic_force_microscopy_afm,0.931978
afm,0.89097
atomic_force_microscopy,0.89097
afm_imaging,0.881847
afm_measurements,0.86911
atomic_force_microscope,0.861706
atomic_force,0.850078
afm_images,0.808489
atomic_force_microscope_afm,0.805404
mica_surface,0.800951
mica_substrate,0.784736
tapping_mode_afm,0.774454
atomic_force_microscopic,0.771778
tapping_mode_atomic_force,0.768202
tapping_mode,0.765395
atomic-force_microscopy,0.754393
force_spectroscopy,0.754373
scanning_probe,0.749717
microscopy_afm,0.748499
multimode_afm,0.74747
afm-based,0.747257
micrometer_scale,0.745377
mica_surfaces,0.742898
afm_force,0.742466
tapping-mode_afm,0.739272
afm_tip,0.729762
tapping-mode,0.726682
scanning_electron_microscopy_sem,0.725533
cryo-tem,0.72311
scanning_force_microscopy,0.722955
mfp-3d_asylum_research,0.722394
nanoscale,0.720236
dimension_icon,0.718759
optical_microscopy,0.717826
scanning_electron_microscopy,0.717282
afm_image,0.713016
mica_substrates,0.713004
nanometer-scale,0.71178
silicon_nitride_tip,0.711563
agilent_afm,0.711309
nanoscopic,0.71102
nanowizard_ii,0.710453
afm_veeco,0.709494
freshly_cleaved_mica,0.709284
high-resolution_afm,0.708164
nanoscope,0.707561
fesem,0.7069
veeco_dimension,0.7067
tm-afm,0.705167
nt-mdt_russia,0.704935
afm_height,0.704547
afm_tips,0.70442
transmission_electron_microscopy_tem,0.704348
afm_tapping_mode,0.70427
scanning_electron,0.703226
scanning_tunneling_microscopy,0.702375
chemical_force_microscopy,0.701873
picotrec_mode,0.701613
single-molecule_force_spectroscopy,0.700711
mica-supported,0.699811
supported_lipid_bilayers,0.69886
digital_instruments_nanoscope,0.698685
ellipsometry,0.698173
afm_scanning,0.697459
asylum_research,0.697335
jpk_instruments_berlin_germany,0.697123
cantilever_tip,0.69505
tapping-mode_atomic_force_microscopy,0.693768
small-angle_x-ray_scattering_saxs,0.693684
high-resolution_tem,0.693341
nanometer_scale,0.692848
veeco,0.692797
afm_scans,0.692143
hr-tem,0.69212
qcm-d,0.69201
afm_cantilever,0.691898
freshly_cleaved_mica_surface,0.690214
high-resolution_transmission_electron,0.690143
cryotem,0.689949
afm_probes,0.689498
small-angle_x-ray_scattering,0.689373
nanoscope_iii,0.689331
veeco_usa,0.68933
nanometric,0.687984
multimode_spm,0.687963
jpk_nanowizard_ii,0.686807
afm_probe,0.686652
microstructures,0.686025
nanoworld_ag,0.684986
nanoindentation_experiments,0.684874
afm_jpk_instruments,0.684664
situ_tem,0.683581
nano-mechanical,0.683271
surface_topography,0.683242
high-resolution_electron_microscopy,0.683227
force_microscopy,0.682847
si3n4_cantilevers,0.682752
pf-qnm,0.682639
nanoscope_v_controller,0.681955
cryo-electron_microscopy,0.680951
asylum_mfp-3d,0.680545
optical_tweezers,0.6803
nanometer_resolution,0.680294
atomic_force_microscopic_images,0.680139
veeco_instruments_santa_barbara,0.67977
nanoscope_iii_digital,0.679404
au_nanowires,0.678777
microscopy_tem,0.67847
cryoelectron_microscopy,0.678088
qcm-d_experiments,0.677724
force-distance_curves,0.677592
tem_images,0.677431
solver_pro,0.677306
nanostructure,0.677258
tem_observations,0.676753
afm_nanoscope,0.676662
nanoscope_v,0.676647
afm_asylum_research,0.676469
fe-sem,0.676438
nanoindentation,0.676008
digital_instruments,0.675846
sem_images,0.675661
nt-mdt,0.675521
nanoscope_iv,0.675043
nanomechanical,0.674648
nanomechanical_properties,0.674201
x-ray_scattering,0.674126
ordered_arrays,0.673809
field_emission_scanning,0.67351
high-resolution_scanning_electron,0.672378
micron-scale,0.672198
nanomechanics,0.67189
mfp-3d-bio,0.671043
nanoindentation_measurements,0.67091
micrometer-sized,0.66995
self-assembly,0.66973
nanowizard,0.669384
high-speed_afm,0.668172
peakforce_qnm,0.668131
hrtem,0.667472
hs-afm,0.667259
multimode_nanoscope,0.667181
vecco,0.667035
atomic_force_micrographs,0.666562
afm_topography_images,0.666193
haadf-stem,0.665818
nanomechanical_property,0.665168
si_cantilevers,0.664624
nanoscope_iiia,0.663443
veeco_metrology_group,0.662278
freshly_cleaved,0.661826
afm_topography,0.661225
tem_grids,0.65899
rotary_shadowing,0.658751
afm_topographical_images,0.658163
cantilevers,0.657933
glass_substrates,0.657476
nanoscope_iiia_controller,0.656738
picoforce,0.656626
nanopores,0.656159
single-molecule_experiments,0.65222
silicon_cantilever,0.65146
glass_substrate,0.650695
langmuir_blodgett,0.650424
submolecular_resolution,0.649532
silicon_substrates,0.64873
atomically_flat,0.648187
glass_surface,0.647621
nanostructural,0.591191
smooth_surface_topography,0.590231
afm_micrograph,0.589714
field-emission_scanning_electron_microscopy,0.589621
nanometer,0.581354
transmission_electron,0.575825
submicron,0.575558
scanning_electron_microscope,0.574006
electron_tomography,0.570663
surface_topographies,0.568888
microscope_afm,0.568686
kelvin_probe_force_microscopy,0.564182
nano-scale,0.563599
stereo-sem,0.562475
nha_particles,0.561709
sem_micrographs,0.561391
nanotubular,0.560095
fetem,0.560065
cryo_electron_microscopy,0.559678
nanoclusters,0.559033
micrometer-scale,0.559001
afm_micrographs,0.558346
microscopy_sem,0.557665
cryogenic_transmission_electron_microscopy,0.557337
scanning_electron_microscopic,0.55719
nano-structure,0.556878
submicrometer,0.556822
spip_software,0.554724
nanoscale_resolution,0.554646
microscopy_hr-tem,0.552663
bio-afm,0.552616
nanometer-scale_resolution,0.552605
sem_image,0.552201
